DocumentCode :
2747483
Title :
Image Denoising Based on Wavelet Domain Spatial Context Modeling
Author :
Li, Xuchao ; Zhu, Shan´an
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou
Volume :
2
fYear :
0
fDate :
0-0 0
Firstpage :
9504
Lastpage :
9508
Abstract :
Using prior knowledge about the spatial clustering of the wavelet coefficients, a new image denoising method that applies the Bayesian framework is proposed. Wavelet coefficients of image are characterized by a two-state Gaussian mixture model (GMM), while their local spatial interactions are modeled by a Markov random field (MRF) model. The Expectation Maximization (EM) algorithm is used to estimate the parameters of the GMM, and an iterative updating technique known as iterative conditional modes (ICM) is applied to optimize the binary labels containing the positions of those wavelet coefficients that represent the useful signal in each subband. For each wavelet coefficient a shrinkage factor is finally determined, depending on its initial shrinkage factor and on the local spatial neighborhood in the label field. The qualitative and quantitative experimental results show that the new scheme outperforms other wavelet denosing methods, such as yielding significantly superior image quality, increasing peak signal-to-noise ratio (PSNR)
Keywords :
Bayes methods; Markov processes; expectation-maximisation algorithm; image denoising; wavelet transforms; Bayesian framework; Markov random field; expectation maximization algorithm; image denoising; image quality; iterative conditional modes; iterative updating technique; peak signal-to-noise ratio; shrinkage factor; spatial clustering; spatial interactions; spatial neighborhood; two-state Gaussian mixture model; wavelet coefficients; wavelet domain spatial context modeling; Bayesian methods; Clustering algorithms; Context modeling; Image denoising; Iterative algorithms; Markov random fields; PSNR; Parameter estimation; Wavelet coefficients; Wavelet domain; Image denoising; Markov random field; Shrinkage factor; Wavelet coefficient;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0332-4
Type :
conf
DOI :
10.1109/WCICA.2006.1713843
Filename :
1713843
Link To Document :
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