DocumentCode
2747499
Title
Unsupervised learning for expert-based software quality estimation
Author
Zhong, Shi ; Khoshgoftaar, Taghi M. ; Seliya, Naeem
Author_Institution
Dept. of Comput. Sci. & Eng., Florida Atlantic Univ., Boca Raton, FL, USA
fYear
2004
fDate
25-26 March 2004
Firstpage
149
Lastpage
155
Abstract
Current software quality estimation models often involve using supervised learning methods to train a software quality classifier or a software fault prediction model. In such models, the dependent variable is a software quality measurement indicating the quality of a software module by either a risk-based class membership (e.g., whether it is fault-prone or not fault-prone) or the number of faults. In reality, such a measurement may be inaccurate, or even unavailable. In such situations, this paper advocates the use of unsupervised learning (i.e., clustering) techniques to build a software quality estimation system, with the help of a software engineering human expert. The system first clusters hundreds of software modules into a small number of coherent groups and presents the representative of each group to a software quality expert, who labels each cluster as either fault-prone or not fault-prone based on his domain knowledge as well as some data statistics (without any knowledge of the dependent variable, i.e., the software quality measurement). Our preliminary empirical results show promising potentials of this methodology in both predicting software quality and detecting potential noise in a software measurement and quality dataset.
Keywords
expert systems; software fault tolerance; software metrics; software quality; unsupervised learning; expert-based software quality estimation; software engineering; software fault prediction model; software modules; software quality classifier; software quality measurement; unsupervised learning; Software quality; Systems engineering and theory; Unsupervised learning;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering, 2004. Proceedings. Eighth IEEE International Symposium on
ISSN
1530-2059
Print_ISBN
0-7695-2094-4
Type
conf
DOI
10.1109/HASE.2004.1281739
Filename
1281739
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