Traceability to national standards for S-parameter measurements in waveguide at 1.1 THz

Author

Horibe, Masahiro ; Kishikawa, Ryoko

Author_Institution

Nat. Inst. of Adv. Ind. Sci. & Technol, Nat. Metrol. Inst. of Japan, Tsukuba, Japan

fYear

2012

fDate

1-6 July 2012

Firstpage

254

Lastpage

255

Abstract

This paper describes a new measurement system to provide high precision traceable scattering parameter measurements of waveguide devices in the frequency range from 750 GHz to 1.1 THz (i.e. in waveguide size WR-01, WM-250). The measurement system comprises Vector Network Analyzer (VNA) at Yamaguchi University and associated primary reference standards provided by the National Metrology Institute of Japan (NMIJ). The standards are precise line sections of waveguide that are used in pre-calibration of the VNA. Traceability to the International System of units (SI) is achieved via precision dimensional measurements of the waveguide aperture and flange. Measurement results with uncertainties are given for traceable measurements in waveguides.

Keywords

S-parameters; calibration; measurement systems; measurement uncertainty; network analysers; submillimetre wave measurement; waveguides; NMIJ; National Metrology Institute of Japan; S-parameter measurements; VNA precalibration; WM-250; WR-01; Yamaguchi University; frequency 750 GHz to 1.1 THz; high precision traceable scattering parameter measurements; measurement system; measurement uncertainties; vector network analyzer; waveguide aperture; waveguide devices; waveguide flange; Apertures; Electromagnetic waveguides; Flanges; Frequency measurement; Measurement uncertainty; Standards; Uncertainty; Tera-Hertz; Vector network analyzers; calibration; submillimeter-wave; traceability; waveguides;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250898

Filename

6250898