Title :
MOVPE grown (Hg, Cd)Te layers for room temperature operating 3-5 μm photoconductive detectors
Author :
Druilhe, R. ; Lorans, D. ; Flachet, J.C. ; Katty, A. ; Triboulet, R. ; Duy, T.Nguyen
Author_Institution :
Lab. de Phis des Solides de Bellevue, CNES, Paris, France
Abstract :
Hg1-xCdxTe (MCT) is the leading material in IR detection. In the aim of extending the IR application field of MCT, the lowest possible cost is required. A first approach is to minimize the cooling requirements in operating at temperatures >200 K, allowing the use of thermoelectric coolers. Photoconductors in the 3-5 μm wavelength window can be operated in a temperature range higher than photodiodes which must be cooled down to 77 K. The use of substrates such as GaAs, with the possibility of electronic integration and of vapor epitaxial techniques such as MBE and MOVPE, is considered. The authors report on the growth, characterization and detector measurements on MOVPE grown Hg0.7Cd0.3Te
Keywords :
II-VI semiconductors; III-V semiconductors; cadmium compounds; gallium arsenide; infrared detectors; mercury compounds; photodetectors; semiconductor epitaxial layers; semiconductor growth; substrates; vapour phase epitaxial growth; 200 K; 293 K; 3 to 5 micron; GaAs; Hg0.7Cd0.3Te-GaAs; II-VI semiconductors; III-V semiconductors; IR detector; MOVPE; cooling; cost; photoconductive detectors; room temperature; semiconductor growth;
Conference_Titel :
Advanced Infrared Detectors and Systems, 1990., Fourth International Conference on
Conference_Location :
London
Print_ISBN :
0-86341-702-7