DocumentCode
2747685
Title
Automated detection of injected faults in a differential equation solver
Author
Last, Mark ; Friedman, Menahem
Author_Institution
Dept. of Inf. Syst. Eng., Ben-Gurion Univ. of Negev, Beer-Sheva, Israel
fYear
2004
fDate
25-26 March 2004
Firstpage
263
Lastpage
264
Abstract
Analysis of logical relationships between inputs and outputs of a computational system can significantly reduce the test execution effort via minimizing the number of required test cases. Unfortunately, the available specification documents are often insufficient to build a complete and reliable model of the tested system. In this paper, we demonstrate the use of a data mining method, called Info-Fuzzy Network (IFN), which can automatically induce logical dependencies from execution data of a stable software version, construct a set of non-redundant test cases, and identify faulty outcomes in new, potentially faulty releases of the same system. The proposed approach is applied to the Unstructured Mesh Finite Element Solver (UMFES) which is a general finite element program for solving 2D elliptic partial differential equations. Experimental results demonstrate the capability of the IFN-based testing methodology to detect several kinds of faults injected in the code of this sophisticated application.
Keywords
data mining; fault tolerant computing; finite element analysis; fuzzy neural nets; partial differential equations; program testing; software reliability; 2D elliptic partial differential equation; IFN; UMFES; automated fault detection; computational system; data mining; differential equation solver; info-fuzzy network; injected faults; software reliability; software test cases; unstructured mesh finite element solver; Automatic testing; Data mining; Differential equations; Fault detection; Fault diagnosis; Finite element methods; Logic testing; Partial differential equations; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering, 2004. Proceedings. Eighth IEEE International Symposium on
ISSN
1530-2059
Print_ISBN
0-7695-2094-4
Type
conf
DOI
10.1109/HASE.2004.1281751
Filename
1281751
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