• DocumentCode
    2747804
  • Title

    A sub-40 mHz laser based on a silicon single-crystal optical cavity

  • Author

    Kessler, Thomas ; Hagemann, Christian ; Sterr, Uwe ; Riehle, Fritz ; Martin, Michael ; Ye, Lun

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, Germany
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    272
  • Lastpage
    273
  • Abstract
    State-of-the-art optical oscillators are limited by thermal noise that causes fluctuations of the cavity length. This laser performance is currently setting the limit for the stability of optical clocks. We demonstrate that single crystal silicon as resonator material can potentially reduce the thermal noise limit for optical cavities by an order of magnitude. We present an experimental realization of such a cavity where the spacer and the mirror substrates are both machined from single crystal silicon and operated at 124 K where the thermal expansion coefficient is zero. We present the setup and performance of this cavity. The stability was analyzed in a three-cornered-hat analysis of heterodyne beat signals among three independent stable lasers. The silicon cavity demonstrates a fractional frequency stability of 1 × 10-16 at short time scales and supports a world-record laser linewidth of <;40 mHz at 1.5 μm.
  • Keywords
    elemental semiconductors; laser cavity resonators; laser frequency stability; laser mirrors; laser noise; semiconductor lasers; silicon; spectral line breadth; thermal expansion; thermal noise; Si; cavity length fluctuations; fractional frequency stability; frequency 40 mHz; heterodyne beat signals; laser performance; laser stability; mirror substrates; optical clocks; optical oscillators; resonator material; silicon single-crystal optical cavity; temperature 124 K; thermal expansion coefficient; thermal noise; three-cornered-hat analysis; wavelength 1.5 mum; world-record laser linewidth; Clocks; Glass; Lead; Resonant frequency; Frequency metrology; Optical reference cavities; Silicon; Sub-Hz laser;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6250907
  • Filename
    6250907