DocumentCode
2747804
Title
A sub-40 mHz laser based on a silicon single-crystal optical cavity
Author
Kessler, Thomas ; Hagemann, Christian ; Sterr, Uwe ; Riehle, Fritz ; Martin, Michael ; Ye, Lun
Author_Institution
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
fYear
2012
fDate
1-6 July 2012
Firstpage
272
Lastpage
273
Abstract
State-of-the-art optical oscillators are limited by thermal noise that causes fluctuations of the cavity length. This laser performance is currently setting the limit for the stability of optical clocks. We demonstrate that single crystal silicon as resonator material can potentially reduce the thermal noise limit for optical cavities by an order of magnitude. We present an experimental realization of such a cavity where the spacer and the mirror substrates are both machined from single crystal silicon and operated at 124 K where the thermal expansion coefficient is zero. We present the setup and performance of this cavity. The stability was analyzed in a three-cornered-hat analysis of heterodyne beat signals among three independent stable lasers. The silicon cavity demonstrates a fractional frequency stability of 1 × 10-16 at short time scales and supports a world-record laser linewidth of <;40 mHz at 1.5 μm.
Keywords
elemental semiconductors; laser cavity resonators; laser frequency stability; laser mirrors; laser noise; semiconductor lasers; silicon; spectral line breadth; thermal expansion; thermal noise; Si; cavity length fluctuations; fractional frequency stability; frequency 40 mHz; heterodyne beat signals; laser performance; laser stability; mirror substrates; optical clocks; optical oscillators; resonator material; silicon single-crystal optical cavity; temperature 124 K; thermal expansion coefficient; thermal noise; three-cornered-hat analysis; wavelength 1.5 mum; world-record laser linewidth; Clocks; Glass; Lead; Resonant frequency; Frequency metrology; Optical reference cavities; Silicon; Sub-Hz laser;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6250907
Filename
6250907
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