Title :
The influence of source impedance in electrical characterization of Solid state lighting sources
Author :
Zhao, D. ; Rietveld, G.
Author_Institution :
VSL, Dutch Metrol. Inst., Delft, Netherlands
Abstract :
This paper investigates the impact of source impedance in electrical characterization of solid state lighting products. A typical current spectrum is given and a model is used to show the significant influence brought about by variable source impedance. In practice, such changes in source impedance are inevitable for measurements done in different locations. A method is proposed to eliminate this impact by inserting a source impedance stabilization network between equipment under test and power supply. It is proved that this method guarantees less than 0.02 % variation in the measurement results which is acceptable for performance evaluation of SSL products.
Keywords :
conformance testing; electric impedance; electric variables measurement; light sources; current spectrum; electrical characterization; equipment under test; power supply; solid state lighting sources; source impedance stabilization network; Current measurement; Impedance; Impedance measurement; Metrology; Power measurement; Solid state lighting; Voltage measurement; Power measurement; measurement repeatability; measurement techniques; solid state lighting; source impedance;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250921
