Title :
Ultra-low power and high speed design and implementation of AES and SHA1 hardware cores in 65 nanometer CMOS technology
Author :
Ge, Feng ; Jain, Pranjal ; Choi, Ken
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
This paper describes a design and implementation of low-power and high-speed security hardware cores for the advanced encryption standard (AES) and the secure hash algorithm (SHA1). We propose three register transfer level (RTL) circuit techniques, namely, application specific register reduction (ASRR), locally explicit clock enabling (LECE), and bus specific clock (BSC). LECE and BSC can be used directly to any ASIC design flow and can be applied for any technology nodes. With 65 nanometer industry technology, our proposed schemes demonstrated at RTL and gate level that for AES, 44.57% total power reduction (dynamic and cell leakage power), 10.43% area reduction, and 5.78 Gbps throughput with 452 MHz circuit speed are achieved and for SHA1, 63.26% total power reduction, 12.72% area reduction with 1.28 GHz circuit speed are achieved.
Keywords :
CMOS integrated circuits; application specific integrated circuits; cryptography; high-speed integrated circuits; low-power electronics; nanoelectronics; AES; ASIC design; CMOS technology; RTL circuit technique; SHA1 hardware cores; advanced encryption standard; application specific register reduction; bit rate 5.78 Gbit/s; bus specific clock; frequency 452 MHz; high speed design; locally explicit clock enabling circuit technique; nanometer industry technology; register transfer level; secure hash algorithm; size 65 nm; ultra-low power design; Algorithm design and analysis; Application specific integrated circuits; CMOS technology; Clocks; Cryptography; Data security; Hardware; Power system security; Registers; Throughput;
Conference_Titel :
Electro/Information Technology, 2009. eit '09. IEEE International Conference on
Conference_Location :
Windsor, ON
Print_ISBN :
978-1-4244-3354-4
Electronic_ISBN :
978-1-4244-3355-1
DOI :
10.1109/EIT.2009.5189651