DocumentCode :
2748513
Title :
Silicon carbide on silicon-an ideal material combination for harsh environment sensor applications
Author :
Kroetz, G. ; Wondrak, W. ; Obermeier, E. ; Cavalloni, C.
Author_Institution :
Res. & Technol., Daimler-Benz AG, Munchen, Germany
Volume :
2
fYear :
1998
fDate :
7-10 Jul 1998
Firstpage :
732
Abstract :
Harsh environment conditions, like high temperatures and/or aggressive media, are usually too much for conventional silicon sensor chips. On the one hand, this limits their applicability and shuts a huge field of measurement and regulation problems in the automotive and aerospace area to microsystemic solutions. On the other hand, for the realisation of sensor chips, micromachining techniques are essential and no other material opens nearly as good possibilities in this respect as silicon. One gets out of this dilemma nicely by the combination of silicon with silicon carbide (SiC), a promising semiconductor material for harsh environment applications. The present paper describes the latest developments in the preparation and application of SiC/Si layer systems. In detail, the PECVD preparation of β-SiC on Si and SiO 2 and the thermal, mechanical, chemical and electronic properties of β-SIC are described. A critical look is taken at the commercial availability of substrates and processes, their costs and their limits, in order to give a realistic picture of future prospects and risks. Application examples in the automotive field (e.g. a combustion pressure sensor) are described and compared to conventional systems
Keywords :
automotive electronics; elemental semiconductors; micromachining; plasma CVD; plasma CVD coatings; pressure sensors; silicon; silicon compounds; PECVD preparation; SiC-Si; aggressive media; applications; automotive field; chemical properties; combustion pressure sensor; commercial availability; electronic properties; harsh environment sensor; high temperature; mechanical properties; micromachining techniques; processes; semiconductor material; substrates; thermal properties; Aerospace materials; Area measurement; Automotive engineering; Chemicals; Mechanical factors; Micromachining; Semiconductor device measurement; Semiconductor materials; Silicon carbide; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 1998. Proceedings. ISIE '98. IEEE International Symposium on
Conference_Location :
Pretoria
Print_ISBN :
0-7803-4756-0
Type :
conf
DOI :
10.1109/ISIE.1998.711714
Filename :
711714
Link To Document :
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