Title :
Uncertainty reduction in the volume measurement of Si spheres by an optical interferometer to determine the Avogadro constant
Author :
Kuramoto, N. ; Inaba, H. ; Fujii, K.
Author_Institution :
Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Abstract :
In the determination of the Avogadro constant using the x-ray crystal density method, volume measurements of Si spheres by optical interferometry play a crucial role. For the accurate volume determination, geometrical shape of the optical components of the interferometer has been evaluated by using ray-tracing method. To reduce the noise in the interference fringes, a new etalon has been developed. An optical frequency comb has been also introduced in the interferometer as the optical frequency standard for more reliable and precise volume measurement. Details of the improvements are described.
Keywords :
elemental semiconductors; frequency standards; light interference; light interferometers; measurement uncertainty; optical constants; optical variables measurement; ray tracing; shapes (structures); silicon; volume measurement; Avogadro constant determination; Si; X-ray crystal density method; etalon; geometrical shape; interference fringe; noise reduction; optical frequency comb; optical frequency standard; optical interferometer; ray-tracing method; sphere; uncertainty reduction; volume measurement; Adaptive optics; Laser beams; Measurement by laser beam; Optical interferometry; Silicon; Uncertainty; Volume measurement; Avogadro constant; optical frequency comb; optical interferometer; silicon crystal; volume measurement;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250949