Design of a 20 GHz DPI method for SOIC8

Author

Land, Sjoerd Op´t ; Perdriau, Richard ; Ramdani, Mohamed ; Gil, Ignacio ; Lafon, Frédéric ; Drissi, M. Hamed

Author_Institution

Dept. of Electron., Ecole Super. d´´Electron. de Ouest, Angers, France

fYear

2012

fDate

17-21 Sept. 2012

Firstpage

1

Lastpage

6

Abstract

The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to determine the power P_trans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk.

Keywords

calibration; crosstalk; printed circuits; DPI method; FR4 printed circuit board; IEC 62132-4 compliant DPI setups; SOIC8 packaged IC; crosstalk; device under test; direct power injection test; frequency 20 GHz; integrated circuits; interference signals; short open load thru calibration; thru reflect line calibration; Calibration; Crosstalk; Feeds; Integrated circuit modeling; Pins; Standards; DPI; EMC; GHz; calibration; centrimetre; crosstalk; immunity; integrated circuit; loss; low-cost; modelling;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on

Conference_Location

Rome

ISSN

2325-0356

Print_ISBN

978-1-4673-0718-5

Type

conf

DOI

10.1109/EMCEurope.2012.6396691

Filename

6396691