DocumentCode :
2748760
Title :
Characterization of EMI filters based on metamaterials
Author :
Gil, I. ; Fernandez, R. ; Vives, Y. ; Jauregui, R. ; Silva, F.
Author_Institution :
Dept. d´´Eng. Electron. (DEE), Univ. Politec. de Catalunya (UPC), Terrassa, Spain
fYear :
2009
fDate :
11-12 June 2009
Firstpage :
1
Lastpage :
3
Abstract :
This paper analyzes the behavior of EMI filters based on metamaterials. The filters are developed by means of sub-wavelength resonators and designed to have notch-type attenuation in the 2.45 GHz band. Two types of filters based on SRR and CSRR rings are presented. The simulated responses by MoM and FDTD are compared with the measurement data obtained from the developed prototypes.
Keywords :
electromagnetic interference; finite difference time-domain analysis; metamaterials; method of moments; resonator filters; EMI filters; FDTD; MoM; metamaterials; notch-type attenuation; subwavelength resonators; Electromagnetic interference; Etching; Finite difference methods; Magnetic materials; Metamaterials; Microstrip filters; Radiofrequency interference; Resonant frequency; Resonator filters; Time domain analysis; EMI filters; metamaterials; microstrip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2009 International Symposium on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-4107-5
Electronic_ISBN :
978-1-4244-4108-2
Type :
conf
DOI :
10.1109/EMCEUROPE.2009.5189682
Filename :
5189682
Link To Document :
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