Title :
10×10 GO guarded Hamon network designed for the Wheatstone bridge for high resistors calibration
Author :
Galliana, F. ; Capra, P.P.
Author_Institution :
Nat. Inst. of Metrol. Res. (INRIM), Turin, Italy
Abstract :
Utilizing and reviewing the project of a Hamon guarded 10×100 MΩ network developed in past years at National Institute of Metrological Research (INRIM) to improve the traceability level of dc resistance at 1 GΩ, also a Hamon 10×10 GΩ guarded network has been built to extend the capabilities of the Hamon method up to 100 GΩ. This network is particularly designed for the use in the modified Wheatstone bridge for high resistors calibration. Construction, guarding, calibration and traceability details on the network are given.
Keywords :
bridge circuits; calibration; electric resistance measurement; resistors; DC resistance traceability level; Hamon guarded network design; INRIM; National Institute of Metrological Research; high resistor calibration; modified Wheatstone bridge; resistance 1 Gohm; Bridge circuits; Calibration; Electrical resistance measurement; Resistance; Resistors; Standards; Voltage measurement; Hamon resistor; calibration technique; guarding system; high resistance measurements; measurements; traceability; uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250956
