• DocumentCode
    2748872
  • Title

    Bilateral comparison of 10 kΩ resistance standards between KRISS and the BIPM

  • Author

    Kim, Wan-Seop ; Yu, Kwang Min ; Kim, Mun-Seog ; Park, Po Gyu ; Kim, Kyu-Tae

  • Author_Institution
    Center for Electr., Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    384
  • Lastpage
    385
  • Abstract
    This paper reports the results of an ongoing bilateral key comparison at 10 kΩ resistance standards between KRISS and the BIPM. Two 10 kΩ travelling resistance standards of the BIPM were measured at KRISS against a 100 Ω transfer standard by using a homemade cryogenic current comparator (CCC) bridge system. The value of the transfer standard resistor maintained at KRISS is calibrated against the quantized Hall resistance at plateau i = 2 using the same CCC. The measurement result shows that the equivalence of about -1 × 10-9 in the resistance calibrations between the two institutions is much smaller than the measurement uncertainty of 32 × 10-9(k=2).
  • Keywords
    Hall effect; electric resistance measurement; measurement standards; measurement uncertainty; BIPM; KRISS; bilateral comparison; cryogenic current comparator bridge system; measurement uncertainty; quantized Hall resistance; resistance 10 kohm; resistance standards; Current measurement; Electrical resistance measurement; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; cryogenic current comparator; key comparison; measurement uncertainty; quantized Hall resistance; resistance standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6250964
  • Filename
    6250964