Title :
Thermal characterization of a coaxial calculable resistor
Author :
Silveira, F.A. ; Vasconcellos, R.T.B.
Author_Institution :
Capacitance & Inductance Lab., Inmetro, Caxias, Brazil
Abstract :
This paper describes the thermal characterization of a coaxial calculable resistor, part of traceability chain of the capacitance unit to the quantum Hall effect, in construction at Inmetro. The realization of the capacitance unit (farad) is related to the QHE by a calculable coaxial resistor, and three low-uncertainty coaxial bridges: the two-terminal and the four-terminal bridges, already in operation at Inmetro; and the quadrature bridge, in final stage of construction.
Keywords :
electric resistance measurement; quantum Hall effect; resistors; Inmetro; QHE; capacitance unit; coaxial calculable resistor thermal characterization; four-terminal bridges; low-uncertainty coaxial bridges; quantum Hall effect; resistance measurements; traceability chain; two-terminal bridges; Bridge circuits; Electrical resistance measurement; Quantum capacitance; Resistors; Temperature measurement; Thermal resistance; Measurement; calculable resistor; measurement standards; precision measurements;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250966
