Author :
Koffman, A. ; Zhang, N.F. ; Wang, Y. ; Shields, S. ; Wood, B. ; Kochav, K. ; Moreno, J.A. ; Sanchez, H. ; Castro, B.I. ; Cazabat, M. ; Ogino, L.M. ; Kyriazis, G. ; Vasconcellos, R.T.B. ; Slomovitz, D. ; Izquierdo, D. ; Faverio, C.
Abstract :
A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.
Keywords :
capacitance measurement; capacitors; silicon compounds; CCEM-K4; CIPM; International Committee for Weights and Measures; MRA; Mutual Recognition Agreement; NMI; National Metrology Institute; RMO; Regional Metrology Organization; SIM.EM-K4; SiO2; capacitance 10 pF; capacitance comparison summary; commercial fused-silica standard capacitor; interAmerican metrology system; key comparison artifact; Atmospheric measurements; Capacitance; Ice; NIST; Particle measurements; Uncertainty; Capacitance measurements; comparison linkage; key comparison; measurement comparison; standard capacitor; uncertainty;
