DocumentCode :
2749204
Title :
Commercialization of computer assisted detection: the path from science to product
Author :
Menhardt, Wido
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
Volume :
2
fYear :
2004
fDate :
1-5 Sept. 2004
Firstpage :
5127
Abstract :
Summary form only given. Computer assisted detection (CAD) is a rapidly growing field with applications in a growing number of diseases, modalities, and anatomies. Academic and industrial research groups worldwide are proposing and publishing new approaches, techniques, and paradigms at an ever-increasing rate: The results are encouraging and imply the potential for dramatic improvements in disease detection and tracking. To researchers, it often seems curious that commercialization of these advances lags far behind academic progress, but there are many obstacles to be overcome, from IP management to QSR (quality systems regulations) compliance, from image data and truth collection to GCP (good clinical practices), from bio-statistics to proof of safety & effectiveness with regulatory agencies. This two-hour session is designed to shed light on experiences in CAD commercialization of innovative CAD technologies into the marketplace. The goal is to share best practices, non-competitive ideas, and "mistakes not to be repeated" among the seminar participants and with researchers in industry and academia. All speakers are involved in bringing a variety of CAD applications to market.
Keywords :
diseases; medical image processing; IP management; bio-statistics; computer assisted detection; diseases; effectiveness; good clinical practices; image processing; quality systems regulations; safety; Anatomy; Application software; Best practices; Commercialization; Coronary arteriosclerosis; Design automation; Diseases; Publishing; Quality management; Safety; CAD; image analysis; image processing; industry; regulations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
Type :
conf
DOI :
10.1109/IEMBS.2004.1404420
Filename :
1404420
Link To Document :
بازگشت