DocumentCode :
2749292
Title :
Large scale integration - LSI1
Author :
Petritz, R.
Author_Institution :
Texas Instruments Incorporated, Dallas, TX, USA
Volume :
14
fYear :
1966
fDate :
21-25 March 1966
Firstpage :
67
Lastpage :
98
Abstract :
A brief review of today´s processing of integrated circuits is given. The major trends in the development of advanced integrated electronics are identified as (1) the broadening of the integrated circuit concept to a large class of circuit function, (2) the processing of more complex circuits within relatively small chips of silicon, and (3) the processing of very large electronic functions on complete slices of silicon. This latter trend, called array technology, is then developed in detail. Emphasis is given to defining the key technological problems.
Keywords :
History; Instruments; Integrated circuit interconnections; Integrated circuit reliability; Integrated circuit technology; Integrated circuit yield; Large scale integration; Resistors; Semiconductor diodes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1958 IRE International Convention Record
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/IRECON.1966.1147685
Filename :
1147685
Link To Document :
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