DocumentCode
2749432
Title
FEM-FCT Based 2D Simulation of Trichel Pulses in Air
Author
Sattari, P. ; Castle, G.S.P. ; Adamiak, K.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
fYear
2010
fDate
3-7 Oct. 2010
Firstpage
1
Lastpage
8
Abstract
In this paper a new two-dimensional model is presented for numerical simulation of Trichel pulses in a point-plane configuration. Both radial and axial components of the electric field are considered and it is assumed that three ionic species exist in the air gap: electrons, and positive and negative oxygen ions. The Poisson equation is solved for electric field calculations and three continuity equations are solved for modeling the transport of charge densities in the air gap. The finite element method (FEM) is used for solving the Poisson equation and a combined Flux Corrected Transport-FEM is used for the charge transport equations. Trichel pulses for different applied voltages are shown and the characteristics of these pulses at different voltages are compared with experimental results reported in the literature. The time variation of the electric field on the corona electrode at different stages of one Trichel pulse is also presented. Moreover, the distributions of electron, positive ion and negative ion densities at different stages of the Trichel pulse are discussed.
Keywords
Poisson equation; air; corona; finite element analysis; plasma density; plasma simulation; plasma transport processes; 2D Trichel pulse simulation; Poisson equation; air gap; charge transport density; charge transport equation; combined flux corrected transport; continuity equation; corona electrode; electric field calculation; electron distribution; finite element method; negative ion density; numerical simulation; point-plane configuration; positive ion distribution; two-dimensional FEM-FCT based model; Atmospheric modeling; Corona; Electric fields; Electrodes; Equations; Ions; Mathematical model;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting (IAS), 2010 IEEE
Conference_Location
Houston, TX
ISSN
0197-2618
Print_ISBN
978-1-4244-6393-0
Type
conf
DOI
10.1109/IAS.2010.5615176
Filename
5615176
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