Title :
Frequency comb referenced displacement interferometry for the NIST calculable capacitor
Author :
Durand, Mathieu ; Lawall, John ; Wang, Yicheng
Author_Institution :
Nat. Inst. Of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
This paper describes the ongoing work on measuring the variable spacing between two electrodes in the next-generation NIST calculable capacitor. The spacing measurement is based on a high finesse Fabry-Perot interferometer system where displacements are inferred from optical frequency measurements. Using a frequency comb referenced to an atomic clock as an optical frequency standard, we achieve a fractional uncertainty of δν/ν ~ 2·10-11 at 2 seconds. This corresponds to a stabilization of the spacing at the picometer level.
Keywords :
Fabry-Perot interferometers; atomic clocks; capacitors; electrodes; frequency measurement; measurement standards; optical variables measurement; NIST calculable capacitor; atomic clock; electrode variable spacing; frequency comb referenced displacement interferometry; high finesse Fabry-Perot interferometer; optical frequency measurement; optical frequency standard; Atom optics; Cavity resonators; Electrodes; Frequency measurement; Optical interferometry; Optical variables measurement; Uncertainty; calculable capacitor; displacement metrology; frequency comb; frequency metrology; length stabilization;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251002