Title :
Electromagnetic near field distribution measurements using optically scanning system
Author :
Takahashi, Masanori ; Kawasaki, Katsumi ; Ohba, Hiroyasu ; Ikenaga, Tomokazu ; Orikasa, Tatsuru ; Ishiyama, Kazushi ; Adachi, Nobuyasu ; Ota, Hiroyasu ; Arai, Ken Ichi
Author_Institution :
Sendai Res. Center, Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan
Abstract :
An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for the high speed, low-invasive measurement of electromagnetic near field distribution. We present some examples of electromagnetic field distribution measurements above a microstrip line using a LiNbO3 or a magnetic garnet crystal substrate and the probe system. We have also measured electromagnetic fields above a commercially available IC using the system.
Keywords :
electric field measurement; electro-optical effects; electromagnetic fields; lithium compounds; magneto-optical effects; microstrip lines; niobium compounds; optical scanners; IC; LiNbO3; electro-optic crystal substrate; electromagnetic near field distribution measurements; galvano scanner; magnetic garnet crystal substrate; magneto-optic crystal substrate; optically scanning electromagnetic field probe system; Antenna measurements; Electromagnetic fields; Electromagnetic measurements; Fiber lasers; High speed optical techniques; Laser beams; Magnetic field measurement; Magnetic materials; Optical beams; Probes; Electromagnetic field; electro-optic effect; galvano scanner; magneto-optic effect;
Conference_Titel :
Electromagnetic Compatibility - EMC Europe, 2009 International Symposium on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-4107-5
Electronic_ISBN :
978-1-4244-4108-2
DOI :
10.1109/EMCEUROPE.2009.5189722
