DocumentCode :
2749645
Title :
An integrated framework of the modeling of failure-detection and fault-correction processes in software reliability analysis
Author :
Lo, Jung-Hua
Author_Institution :
Dept. of Inf., Fo Guang Univ., I-Lan
fYear :
2008
fDate :
13-16 July 2008
Firstpage :
557
Lastpage :
562
Abstract :
The failure-detection and fault-correction are critical processes in attaining good performance of software quality. In this paper, we propose several improvements on the conventional software reliability growth models (SRGMs) to describe actual software development process by eliminating some unrealistic assumptions. Most of these models have focused on the failure detection process and not given equal priority to modeling the fault correction process. But, most latent software errors may remain uncorrected for a long time even after they are detected, which increases their impact. The remaining software faults are often one of the most unreliable reasons for software quality. Therefore, we develop a general framework of the modeling of the failure detection and fault correction processes. Furthermore, we also analyze the effect of applying the delay-time non-homogeneous Poisson process (NHPP) models. Finally, numerical examples are shown to illustrate the results of the integration of the detection and correction process.
Keywords :
software fault tolerance; software quality; stochastic processes; delay-time nonhomogeneous Poisson process model; failure detection modeling; fault correction process; software development; software quality; software reliability growth model; Delay effects; Delay estimation; Error correction; Failure analysis; Fault detection; Least squares approximation; Maximum likelihood detection; Software quality; Software reliability; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
Conference_Location :
Daejeon
ISSN :
1935-4576
Print_ISBN :
978-1-4244-2170-1
Electronic_ISBN :
1935-4576
Type :
conf
DOI :
10.1109/INDIN.2008.4618163
Filename :
4618163
Link To Document :
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