• DocumentCode
    2749645
  • Title

    An integrated framework of the modeling of failure-detection and fault-correction processes in software reliability analysis

  • Author

    Lo, Jung-Hua

  • Author_Institution
    Dept. of Inf., Fo Guang Univ., I-Lan
  • fYear
    2008
  • fDate
    13-16 July 2008
  • Firstpage
    557
  • Lastpage
    562
  • Abstract
    The failure-detection and fault-correction are critical processes in attaining good performance of software quality. In this paper, we propose several improvements on the conventional software reliability growth models (SRGMs) to describe actual software development process by eliminating some unrealistic assumptions. Most of these models have focused on the failure detection process and not given equal priority to modeling the fault correction process. But, most latent software errors may remain uncorrected for a long time even after they are detected, which increases their impact. The remaining software faults are often one of the most unreliable reasons for software quality. Therefore, we develop a general framework of the modeling of the failure detection and fault correction processes. Furthermore, we also analyze the effect of applying the delay-time non-homogeneous Poisson process (NHPP) models. Finally, numerical examples are shown to illustrate the results of the integration of the detection and correction process.
  • Keywords
    software fault tolerance; software quality; stochastic processes; delay-time nonhomogeneous Poisson process model; failure detection modeling; fault correction process; software development; software quality; software reliability growth model; Delay effects; Delay estimation; Error correction; Failure analysis; Fault detection; Least squares approximation; Maximum likelihood detection; Software quality; Software reliability; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Informatics, 2008. INDIN 2008. 6th IEEE International Conference on
  • Conference_Location
    Daejeon
  • ISSN
    1935-4576
  • Print_ISBN
    978-1-4244-2170-1
  • Electronic_ISBN
    1935-4576
  • Type

    conf

  • DOI
    10.1109/INDIN.2008.4618163
  • Filename
    4618163