Title :
A novel concurrent error detection scheme for FFT networks
Author :
Tao, D.L. ; Hartmann, C.R.P. ; Chen, Y.S.
Author_Institution :
Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
Abstract :
A novel algorithm-based fault tolerance scheme is proposed for fast Fourier transform (FFT) networks. It is shown that the proposed scheme achieves 100% fault coverage theoretically. An accurate measure of the fault coverage for FFT networks is provided by taking the roundoff error into account. It is shown that the proposed scheme maintains the low hardware overhead and high throughput of J.Y. Jou and J.A. Abraham´s scheme and, at the same time, increases the fault coverage significantly.<>
Keywords :
error detection; fast Fourier transforms; fault tolerant computing; signal processing; FFT networks; algorithm-based fault tolerance scheme; concurrent error detection scheme; fault coverage; roundoff error; Circuit faults; Fast Fourier transforms; Fault detection; Fault tolerance; Hardware; Matrix decomposition; Roundoff errors; Signal processing algorithms; Throughput; Very large scale integration;
Conference_Titel :
Fault-Tolerant Computing, 1990. FTCS-20. Digest of Papers., 20th International Symposium
Conference_Location :
Newcastle Upon Tyne, UK
Print_ISBN :
0-8186-2051-X
DOI :
10.1109/FTCS.1990.89346
