DocumentCode :
2749746
Title :
Checking the Accuracy of Environmental Data for Compliance with Environmental Rules
Author :
Ninagawa, Noriyasu ; Hamatsuka, Yasuhiro ; Yamamoto, Noriaki ; Hiroshige, Yuzo
Author_Institution :
Hitachi Ltd., Yokohama
fYear :
2007
fDate :
7-10 May 2007
Firstpage :
79
Lastpage :
84
Abstract :
The worldwide spread of environmental rules concerning electrical and electronic equipment has increased the need for improved efficiency of Design for Environment (DfE). At present, assembly manufacturers request parts suppliers to submit parts data to confirm compliance with environmental rules. Assembly manufacturers are especially interested in the chemical content of parts. When confirming the accuracy of the data, an analytical instrument is often utilized by both assembly manufacturers and parts suppliers. However, it takes a huge number of man-hours. To solve this problem, we have proposed methodology to check the accuracy of environmental data, especially the chemical content of parts, without using an analytical instrument. Here we have developed logic to extract benchmark data and the trend of substance use from the existing parts database by applying statistical processes. "Benchmark data" are used for comparison to confirm environmental data for parts. We also developed a tool that produces a benchmark map, which is a matrix of benchmark data. As a result we found that each material or parts classification has different benchmark data and its trend. By our proposed method, we conclude that the use of benchmark data will reduce the risk of nonconformity or the number of man-hours needed for parts selection and parts qualification.
Keywords :
design for environment; electrical products; electronic products; environmental management; government policies; assembly manufacturers; design for environment; electrical equipment; electronic equipment; environmental data accuracy; environmental rules; material classification; parts chemical content; parts classification; parts data; Assembly; Chemical analysis; Data analysis; Data mining; Databases; Electronic equipment; Electronic equipment manufacture; Instruments; Logic; Manufacturing; Accuracy; Assembly Manufacturer; Benchmark Data; Material Declaration; Quality Assurance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics & the Environment, Proceedings of the 2007 IEEE International Symposium on
Conference_Location :
Orlando, FL
ISSN :
1095-2020
Print_ISBN :
1-4244-0861-X
Type :
conf
DOI :
10.1109/ISEE.2007.369371
Filename :
4222860
Link To Document :
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