Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

Author

Hale, Paul D. ; Williams, Dylan F. ; Dienstfrey, Andrew ; Wang, Jack ; Jargon, Jeffrey ; Humphreys, David ; Harper, Matthew ; Füser, Heiko ; Bieler, Mark

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

2012

fDate

1-6 July 2012

Firstpage

522

Lastpage

523

Abstract

Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform measurements and the SI. These services are increasingly switching to a full waveform metrology paradigm, obtaining an estimate of the central value and associated uncertainty of the entire waveform as a function of time.

Keywords

calibration; electric variables measurement; oscilloscopes; signal processing equipment; signal sampling; NIST; NPL; PTB; electro-optic sampling; full waveform metrology; high speed electrical waveform; high speed waveform measurement; measurement services; traceable calibration chain; Calibration; Coplanar waveguides; Electrooptical waveguides; Measurement by laser beam; NIST; Oscilloscopes; Uncertainty; Electro-optic sampling; metrology; oscilloscope; photodetector; pulse; ultrafast; uncertainty; waveform;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251033

Filename

6251033