DocumentCode :
2750088
Title :
Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Author :
Hale, Paul D. ; Williams, Dylan F. ; Dienstfrey, Andrew ; Wang, Jack ; Jargon, Jeffrey ; Humphreys, David ; Harper, Matthew ; Füser, Heiko ; Bieler, Mark
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
522
Lastpage :
523
Abstract :
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform measurements and the SI. These services are increasingly switching to a full waveform metrology paradigm, obtaining an estimate of the central value and associated uncertainty of the entire waveform as a function of time.
Keywords :
calibration; electric variables measurement; oscilloscopes; signal processing equipment; signal sampling; NIST; NPL; PTB; electro-optic sampling; full waveform metrology; high speed electrical waveform; high speed waveform measurement; measurement services; traceable calibration chain; Calibration; Coplanar waveguides; Electrooptical waveguides; Measurement by laser beam; NIST; Oscilloscopes; Uncertainty; Electro-optic sampling; metrology; oscilloscope; photodetector; pulse; ultrafast; uncertainty; waveform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6251033
Filename :
6251033
Link To Document :
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