Impedance of active devices using a real time digital oscilloscope and quarter-wave technique

Author

Miall, James

Author_Institution

Nat. Phys. Lab., Teddington, UK

fYear

2012

fDate

1-6 July 2012

Firstpage

524

Lastpage

525

Abstract

A system has been constructed for measuring the reflection coefficient of active devices using a reflectometer with phase sensitive voltage measurements based on a real-time digital sampling oscilloscope with timebase correction provided by a reference pilot tone. A calibration scheme which does not require calculation of the reflectometer S-parameters or error terms is used by applying a small offset frequency from that of the active device.

Keywords

calibration; electric impedance measurement; oscilloscopes; phase measurement; reflectometers; voltage measurement; active device impedance; calibration scheme; phase sensitive voltage measurement; quarter-wave technique; real-time digital sampling oscilloscope; reference pilot tone; reflection coefficient measurement; reflectometer S-parameter; small offset frequency; timebase correction; Frequency measurement; Impedance; Oscilloscopes; Phase measurement; Reflection; Scattering parameters; Voltage measurement; active device; cross ratio; reflection coefficient; reflectometer; timebase correction;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251034

Filename

6251034