DocumentCode :
2750182
Title :
Study of Relations between Several Factors in Immersion Silver Technique and Galvanic Attack Problem
Author :
Li, Kun ; Xiang, Dong ; Liu, Xueping
Author_Institution :
Tsinghua Univ., Shenzhen
fYear :
2007
fDate :
7-10 May 2007
Firstpage :
202
Lastpage :
205
Abstract :
To control lead pollution," Hot Air Solder Leveling "(HASL), the traditional lead-contained PCB(Printed Circuit Board) surface finish, needs to be replaced by lead- free technique. Immersion Silver (I-Ag) has many merits compared to other lead-free techniques, thereby being increasingly widely used. However, a problem named "galvanic attack", which seriously erodes copper where circuit connects pad, is a serious obstacle to I-Ag\´s popularization. According to manufacturing experience, consistency of silver ion, temperature, mircoetch rate and liquid level are four major factors in I-Ag process. In this paper, relations between these factors and galvanic attack are studied by experiments. From these relations we get inspirations to reduce galvanic attack in engineering practice.
Keywords :
copper; erosion; galvanising; lead; pollution control; printed circuits; silver; solders; surface finishing; Ag; Cu; Pb; copper erodes; galvanic attack problem; hot air solder leveling; immersion silver technique; lead pollution control; lead- free technique; lead-contained printed circuit board; mircoetch rate; silver ion; surface finish; Air pollution; Copper; Environmentally friendly manufacturing techniques; Galvanizing; Lead; Manufacturing processes; Printed circuits; Silver; Surface contamination; Surface finishing; Immersion silver; galvanic attack;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics & the Environment, Proceedings of the 2007 IEEE International Symposium on
Conference_Location :
Orlando, FL
ISSN :
1095-2020
Print_ISBN :
1-4244-0861-X
Type :
conf
DOI :
10.1109/ISEE.2007.369394
Filename :
4222883
Link To Document :
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