Title :
Modeling of a sampling system based on Sigma-Delta ADC for data acquisition in metrology
Author :
Iuzzolino, Ricardo ; Palafox, Luis ; Behr, Ralf
Author_Institution :
Inst. Nac. de Tecnol. Ind., Buenos Aires, Argentina
Abstract :
This paper describes the use of modeling to improve the accuracy of a sampling system built around a Sigma-Delta analog-to-digital converter. The parameters of the model were established using waveforms from a programmable Josephson array. The validation results have shown that the achievable accuracy is within 8 μV/V for signals in the frequency range up to 1.3 kHz at equivalent sampling rates below 32 kHz.
Keywords :
data acquisition; sampling methods; sigma-delta modulation; data acquisition; programmable Josephson array; sampling system modeling; sigma-delta ADC; sigma-delta analog-to-digital converter; Accuracy; Data models; Metrology; Sigma delta modulation; Transfer functions; Uncertainty; Josephson voltage standard; Sigma-Delta data converters; analog/digital conversion; model parameter identification; modeling;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251040