Title :
Pin margin analysis
Author :
Huston, Robert E.
Author_Institution :
Credence Syst. Corp., Fremont, CA, USA
Abstract :
A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins
Keywords :
automatic test equipment; controllability; economics; maintenance engineering; observability; optimisation; ATE characteristics; DUT; Pin Margin Analysis; controllability; observability; program maintenance cost; test margins; test program standards; Automatic test equipment; Automatic testing; Costs; Displays; Lead; Pins; Silicon; System testing; Timing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639677
