DocumentCode
2750253
Title
Pin margin analysis
Author
Huston, Robert E.
Author_Institution
Credence Syst. Corp., Fremont, CA, USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
655
Lastpage
662
Abstract
A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins
Keywords
automatic test equipment; controllability; economics; maintenance engineering; observability; optimisation; ATE characteristics; DUT; Pin Margin Analysis; controllability; observability; program maintenance cost; test margins; test program standards; Automatic test equipment; Automatic testing; Costs; Displays; Lead; Pins; Silicon; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639677
Filename
639677
Link To Document