• DocumentCode
    2750356
  • Title

    Resonant Hole States and Multichannel Scattering at Quantum-Well Heterostructures

  • Author

    Polupanov, Alexander F. ; Galiev, Vjacheslav I. ; Kruglov, Alexis N.

  • Author_Institution
    Inst. of Radio-Eng. & Electron., Russian Acad. of Sci., Moscow
  • fYear
    2006
  • fDate
    June 29 2006-July 1 2006
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    A numerical method was developed to calculate analytical continuation of S-matrix, which describes multichannel scattering at quantum wells, into the region of complex "nonphysical" energy values. One or several resonant hole states related to poles of S-matrix and to the absolute reflection at hole scattering on a quantum well were found to exist in the energy range where only heavy holes may propagate over barriers. Energies of resonant states (i.e. real parts of complex values of S-matrix poles) are close to those of peaks of absolute reflection. The qualitative behaviour of the over-barrier scattering and resonant states is the same at all material parameters and quantum well shapes, however lifetimes of resonant states depend strongly on all parameters. It appears that these resonant states account for the efficient hole capture by quantum wells
  • Keywords
    S-matrix theory; light reflection; light scattering; resonant states; semiconductor quantum wells; S-matrix; absolute reflection; hole scattering; multichannel scattering; over-barrier scattering; quantum well shapes; quantum-well heterostructures; resonant hole states; semiconductor quantum wells; Optical reflection; Particle scattering; Physics; Quantum mechanics; Quantum wells; Resonance light scattering; Scattering parameters; Schrodinger equation; Semiconductor materials; Shape; resonant states; semiconductor quantum wells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Laser and Fiber-Optical Networks Modeling, 8-th International Conference on
  • Conference_Location
    Kharkiv
  • Print_ISBN
    1-4244-0233-6
  • Electronic_ISBN
    1-4244-0234-4
  • Type

    conf

  • DOI
    10.1109/LFNM.2006.252084
  • Filename
    4018303