Title :
Study on two types of commercial ESD simulators
Author :
Ruan Xiaofen ; Zhang Xijun ; Wu Zhancheng ; Wang Shuping
Author_Institution :
Mech. Eng. Coll., Electrostatic & Electromagn. Protection Res. Inst., Hebei, China
Abstract :
In this paper, the performances of two types of ESD simulators (ESS-200AX made in Noiseken and NSG435 made in Schaffner) are studied, and ESD immunity experiments of a single chip microcomputer (SCM) system are made. The experimental results show that the differences between two simulators yield inconsistent test results though they both comply with the IEC61000-4-2 ESD standard. Therefore, besides the ESD current waveform, the relevant IEC61000-4-2 ESD standard should specify the discharge current derivative, related electromagnetic field in detail, and give unified specifications for the construction and configuration of ESD simulators.
Keywords :
IEC standards; electromagnetic compatibility; electromagnetic fields; electrostatic discharge; immunity testing; simulation; EMC; ESD immunity; ESD simulator configuration; ESD simulator construction; ESS-200AX; IEC61000-4-2 standard; NSG435; SCM system; discharge current derivative; performance; related electromagnetic field; single chip microcomputer; unified specification; Calibration; Current measurement; Electrodes; Electromagnetic compatibility; Electronic equipment testing; Electrostatic discharge; IEC standards; Immunity testing; Switches; Voltage;
Conference_Titel :
Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Asia-Pacific Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
7-5635-0802-3
DOI :
10.1109/CEEM.2003.237921