Title :
Dynamic bridge standard for strain gauge bridge amplifier calibration
Author :
Beug, M. Florian ; Moser, Harald ; Ramm, Günther
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
Abstract :
This article presents a newly at PTB developed dynamic bridge standard for frequency dependent calibration of strain gauge and piezo-resistive bridge amplifiers. The bridge standard operates in a ratiometric mode by picking up the dc bridge supply voltage which is provided by the bridge amplifier under calibration. The sinusoidal or arbitrary calibration signal, the output voltage of the bridge standard, is generated by multiplying digital-to-analogue converters in combination with a resistive voltage divider. Additionally a reference signal is provided for phase calibration. The bridge standard provides the ability of static and dynamic strain gauge bridge amplifier amplitude and phase calibration in the frequency range from up to 10 kHz. The provided frequency range covers a wide range of industrial measurements of dynamic mechanical quantities such as dynamic force, torque, and pressure.
Keywords :
bridge instruments; calibration; digital-analogue conversion; instrumentation amplifiers; phase measurement; strain gauges; voltage dividers; PTB developed dynamic bridge standard; arbitrary calibration signal; dc bridge supply voltage; digital-to-analogue converters; dynamic force; dynamic mechanical quantiy industrial measurements; dynamic strain gauge bridge amplifier amplitude calibration; dynamic strain gauge bridge amplifier phase calibration; output voltage; phase calibration; piezoresistive bridge amplifier calibration; ratiometric mode; reference signal; resistive voltage divider; sinusoidal calibration signal; Bridge circuits; Calibration; Dynamics; Frequency measurement; Standards; Strain; Vehicle dynamics; Dynamic bridge standard system; electrical measurements of mechanical quantities; strain gauge bride amplifiers;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251056