DocumentCode :
2750578
Title :
Investigating the use of multimeters to measure high value capacitors at low frequencies against the quantized Hall resistance
Author :
Satrapinski, A. ; Suomalainen, E.P. ; Immonen, P.
Author_Institution :
MIKES, Espoo, Finland
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
576
Lastpage :
577
Abstract :
Possibilities and limitations of using measurement system based on two sampling multimeters (DVM) for the ratio measurement of two impedances was investigated in MIKES. Calibration of a 1 μF capacitor from the quantized Hall resistance (QHR) was made at low frequencies. A frequency dependence of ceramic 1 μF capacitor in frequency range 12 Hz - 1600 Hz was measured against different reference resistors at low voltage level with the ratios of 1:1 to 1:100. A 1 μF capacitor can be measured at low frequency directly against the QHR by using precision DVM with proper estimation of applied corrections.
Keywords :
calibration; capacitance measurement; capacitors; digital multimeters; electric resistance measurement; measurement systems; radiofrequency measurement; resistors; DVM; MIKES; QHR; capacitance 1 muF; capacitor calibration; frequency 12 Hz to 1600 Hz; high value capacitor measurement; impedance measurement; measurement system; quantized Hall resistance; reference resistors; sampling multimeters; Bridge circuits; Capacitors; Electrical resistance measurement; Frequency measurement; Measurement uncertainty; Uncertainty; Voltage measurement; High value capacitors; calibration; low frequency; measurement uncertainty; precision measurements; voltage sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6251060
Filename :
6251060
Link To Document :
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