Title :
Improvement of high-value capacitance measurement
Author :
Dai Dongxue ; He Xiaobing ; Wang Wei ; Li Yanqiang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
This paper describes improvement of high-value capacitance measurement method based on the sampling technology and the inductive shunt. The method can measure capacitance from 10μF to 1mF, frequency from 100 Hz to 1 kHz.
Keywords :
capacitance measurement; sampling methods; capacitance 10 muF to 1 mF; frequency 100 Hz to 1 kHz; high-value capacitance measurement method; inductive shunt; sampling technology; Calibration; Capacitance; Capacitance measurement; Capacitors; Current measurement; Resistors; Voltage measurement; High-value capacitance; inductive shunt; non-integer-period; sampling technology; uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251064
