Title :
Sampling ratio bridge for impedance measurements down to 1 mΩ
Author :
Van den Brom, Helko E. ; Dierikx, Erik F. ; Jo, L.
Author_Institution :
VSL Dutch Metrol. Inst., Delft, Netherlands
Abstract :
This paper describes the development of a current-driven automated sampling ratio bridge for the accurate measurement of low-ohmic impedance standards. Initial tests at 50 Hz and 1 kHz indicate that relative uncertainties of a few times 10-6 can be obtained for ratios of 10 Ω to 100 ΩO. For lower impedance values the uncertainty will increase. We demonstrated operating the bridge for AC resistance values down to 1 mΩ.
Keywords :
bridge instruments; electric impedance measurement; measurement uncertainty; AC resistance values; current-driven automated sampling ratio bridge; frequency 1 kHz; frequency 50 Hz; low-ohmic impedance measurement standards; resistance 10 ohm to 100 ohm; Bridge circuits; Current measurement; Current transformers; Electrical resistance measurement; Impedance; Impedance measurement; Voltage measurement; AC resistance; Impedance measurement; digital sampling; impedance ratio bridge;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251066
