Title :
A DSP-based feedback loop for mixed-signal VLSI testing
Author :
Prabhu, Lakshmikantha S. ; Rosenthal, Daniel A.
Abstract :
Implementing a feedback loop system for a mixed-signal VLSI test system by using an embedded digital signal processing (DSP) unit provides superior flexibility in device testing applications. This paper describes such a DSP feedback loop within the context of a mixed-signal VLSI test system, while discussing a number of potential applications and their implications
Keywords :
VLSI; automatic test equipment; digital signal processing chips; feedback; integrated circuit testing; mixed analogue-digital integrated circuits; ADC servo-loop test design; DSP; embedded digital signal processing; feedback loop testing; hardware configuration; mixed-signal VLSI testing; software architecture; Digital signal processing; Feedback loop; Hardware; Instruments; Pins; Signal generators; Software testing; Synchronization; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639679
