A DSP-based feedback loop for mixed-signal VLSI testing

Author

Prabhu, Lakshmikantha S. ; Rosenthal, Daniel A.

fYear

1997

fDate

1-6 Nov 1997

Firstpage

670

Lastpage

674

Abstract

Implementing a feedback loop system for a mixed-signal VLSI test system by using an embedded digital signal processing (DSP) unit provides superior flexibility in device testing applications. This paper describes such a DSP feedback loop within the context of a mixed-signal VLSI test system, while discussing a number of potential applications and their implications

Keywords

VLSI; automatic test equipment; digital signal processing chips; feedback; integrated circuit testing; mixed analogue-digital integrated circuits; ADC servo-loop test design; DSP; embedded digital signal processing; feedback loop testing; hardware configuration; mixed-signal VLSI testing; software architecture; Digital signal processing; Feedback loop; Hardware; Instruments; Pins; Signal generators; Software testing; Synchronization; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639679

Filename

639679

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2750694