DocumentCode :
2751115
Title :
The Microscopy Serial Image Synthesis Based on the Wavelet Analysis
Author :
Xiong, Sichang ; Yang, Yong ; Fan, Wei
Author_Institution :
MOE Key Lab. of Mech. Manuf. & Autom., Zhejiang Univ. of Technol., Hangzhou
Volume :
2
fYear :
0
fDate :
0-0 0
Firstpage :
10467
Lastpage :
10471
Abstract :
Due to the limitation of the microscopic focal length, the obtained microscopic images are often blurred in some local areas, which causes that people can not recognize or understand it completely. Based on the different energy distributions of the low-frequency band and the high-frequency band, which are achieved by discrete wavelets transform, an original method for wavelet coefficient combination is proposed in this paper. It takes the ratio of the two bands as a characteristic value and the maximum value is chosen as an integration rule for determining new wavelet coefficients. This method can remove the defocused areas and reduce the distortion of the fused images. Finally, the advantage of the proposed fusion approach is demonstrated clearly by practical experiments, by comparison with conventional area based pixel selection method. From the microscopy full-focus image, researchers can measure the desired results directly
Keywords :
discrete wavelet transforms; image restoration; microscopy; discrete wavelets transform; microscopy full-focus image; microscopy serial image synthesis; wavelet analysis; wavelet fusion; Discrete wavelet transforms; Distortion measurement; Image analysis; Image generation; Image recognition; Laboratories; Manufacturing automation; Microscopy; Wavelet analysis; Wavelet coefficients; depth from focus; microscopy full-focus image; wavelet fusion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0332-4
Type :
conf
DOI :
10.1109/WCICA.2006.1714055
Filename :
1714055
Link To Document :
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