DocumentCode :
2751288
Title :
Development of an electro-optic sampling system at LNE
Author :
Tian, Wei ; Allal, Djamel ; Boudebs, Georges ; Charles, Michaël ; Ndiaye, Oumy ; Vincent, Patricia
Author_Institution :
Lab. Nat. de Metrol. et d´´Essais (LNE), Trappes, France
fYear :
2012
fDate :
1-6 July 2012
Firstpage :
654
Lastpage :
655
Abstract :
We present the development of an electro-optic sampling system for the calibration of an electrical impulse response standard photodiode. The configuration uses a 100 μm thick LiTaO3 or GaAs electro-optic crystal placed above a coplanar waveguide supported by a glass substrate. Transverse dimensions of the coplanar waveguide are adjusted in order to obtain a good impedance match between the free sections of the coplanar waveguide and the section covered by the electro-optic crystal. The electro-optic sampling system uses a mode-locked fiber laser producing a train of pulses at 1550 nm with pulse duration of about 90 fs.
Keywords :
calibration; coplanar waveguides; electro-optical devices; fibre lasers; impedance matching; photodiodes; transient response; LNE; calibration; coplanar waveguide; electrical impulse response standard photodiode; electro-optic sampling system; electrooptic crystal; glass substrate; impedance matching; mode-locked fiber laser; size 100 mum; transverse dimension; wavelength 1550 nm; Calibration; Coplanar waveguides; Crystals; Electrooptic effects; Electrooptical waveguides; Photodiodes; Probes; Coplanar waveguide; electro-optic sampling; oscilloscope calibration; photodiode calibration; waveform metrology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6251099
Filename :
6251099
Link To Document :
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