Title :
Parameterizable testing scheme for FIR filters
Author :
Mukherjee, Nilanjan ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Eng. Res. Center, Lucent Technol., Princeton, NJ, USA
Abstract :
This paper presents a new pseudo-exhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed in a built-in self-test (BIST) environment to detect any combinational faults occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to test systematically all FIR filter building blocks
Keywords :
FIR filters; adders; built-in self test; combinational circuits; logic testing; multiplying circuits; FIR filters; built-in self-test environment; combinational faults; digital finite impulse response; linear phase comb filters; phase-shift multipliers; pseudo-exhaustive patterns; pseudo-exhaustive test methodology; sign-extended adders; Adders; Built-in self-test; Digital filters; Fault detection; Finite impulse response filter; Impulse testing; Nonlinear filters; Phase detection; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639682
