A new method for measuring the relative spectral responsivity of detectors based on a pulsed OPO tunable from 210 to 2000 nm

Author

Hong, Kee Suk ; Lee, Dong-Hoon ; Park, Seongchong ; Park, Seung-Nam

Author_Institution

Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea

fYear

2012

fDate

1-6 July 2012

Firstpage

668

Lastpage

669

Abstract

We describe a novel method to measure the relative spectral responsivity of detectors based on a pulsed OPO tunable from 210 nm to 2000 nm. Si and InGaAs photodiodes are compared to a pyro-electric detector as Reference (REF) at each laser pulse from the OPO with a duration of several ns and a repetition rate of 1 kHz based on a beam splitter and single-pulse data acquisition.

Keywords

III-V semiconductors; data acquisition; elemental semiconductors; measurement by laser beam; optical beam splitters; optical parametric oscillators; optical sensors; photodetectors; photodiodes; silicon; InGaAs; Si; beam splitter; frequency 1 kHz; laser pulsed OPO tuning; optical parametric oscillator; photodiode; pyroelectric detector; relative spectral responsivity measurement; single-pulse data acquisition; wavelength 210 nm to 2000 nm; Detectors; Laser beams; Measurement by laser beam; Photodiodes; Pulse measurements; Silicon; Wavelength measurement; optical radiometry; spectral responsivity; tunable OPO;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6251106

Filename

6251106