DocumentCode :
2751452
Title :
Positioning of InAs quantum dots on sub-250 nm facets using selective area epitaxy
Author :
Tsui, Raymond ; Zhang, Ruth ; Shiralagi, Kumar ; Goronkin, Herbert
Author_Institution :
Phoenix Corp. Res. Labs., Motorola Inc., Tempe, AZ, USA
fYear :
1997
fDate :
8-11 Sep 1997
Firstpage :
531
Lastpage :
534
Abstract :
Using oxide-patterned substrates, we have selectively grown GaAs mesas with (100) top facets ranging from several μm to less than 250 nm in width and InAs quantum dots (QDs) on top of these facets. For a given total InAs coverage, the dot density varies with the facet width. The QDs also tend to form at the facet edges. These observations suggest a strong surface diffusion effect of In-containing species adsorbed on the various GaAs facets of a mesa. By designing the oxide pattern in an appropriate manner, a two-dimensional array of QDs could be positioned in a pre-determined configuration at specific wafer locations
Keywords :
III-V semiconductors; chemical beam epitaxial growth; gallium arsenide; indium compounds; semiconductor growth; semiconductor quantum dots; surface diffusion; 250 nm; GaAs; InAs; InAs quantum dots; dot density; facet width; oxide pattern; oxide-patterned substrates; selective area epitaxy; strong surface diffusion effect; sub-250 nm facets; two-dimensional array; Buffer layers; Epitaxial growth; Etching; Gallium arsenide; Intrusion detection; Laboratories; Quantum dots; Substrates; Temperature; US Department of Transportation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7503-0556-8
Type :
conf
DOI :
10.1109/ISCS.1998.711732
Filename :
711732
Link To Document :
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