• DocumentCode
    2751690
  • Title

    Automatic Detection of Laser Damage Threshold by Scattering Light Technique

  • Author

    Liu, Anping ; Duan, Lihua ; Hu, Jianping ; Tang, Ming

  • Author_Institution
    Coll. of Sci.,, Chongqing Univ.
  • Volume
    2
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    5318
  • Lastpage
    5321
  • Abstract
    A damage detection and assessment system based on laser-induced changes in surface scattering is reported. It is integrated with a 1064nm, 532nm, 355nm damage test facility used for routine testing of production optics. HfO2/SiO2 HR-coating and HfO 2/SiO2 AR-coating were tested by this system, and compared with plasma spark method and Nomarski phase contrast microscope method. The results show He-Ne scattering technique is an effective, reliable technique. Plasma spark intensity varies with different film material and plate fashion, and Nomarski phase contrast microscope observation method is an international standard detection method, but it can´t detect some damages and is difficult to detect on line
  • Keywords
    antireflection coatings; hafnium compounds; laser beam effects; light scattering; optical testing; silicon compounds; He-Ne scattering technique; HfO2-SiO2; HfO2/SiO2 AR-coating; HfO2/SiO2 HR-coating; Nomarski phase contrast microscope method; automatic detection; damage detection; damage test facility; international standard detection method; laser damage threshold; laser-induced damage; plasma spark method; production optics; scattering light technique; surface scattering; Hafnium oxide; Laser transitions; Light scattering; Microscopy; Optical scattering; Phase detection; Plasma materials processing; Sparks; Surface emitting lasers; Test facilities; automatic detection; damage threshold; laser-induced damage; scattering light technique;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
  • Conference_Location
    Dalian
  • Print_ISBN
    1-4244-0332-4
  • Type

    conf

  • DOI
    10.1109/WCICA.2006.1714085
  • Filename
    1714085