Title :
Double-shielded sample stage for single-electron devices
Author :
Manninen, A.J. ; Kemppinen, A. ; Mykkänen, E. ; Koivula, H. ; Hahtela, O. ; Maisi, V.F. ; Lotkhov, S.V. ; Zorin, A.B. ; Saira, O. -P ; Pekola, J.P.
Author_Institution :
Centre for Metrol. & Accreditation (MIKES), Espoo, Finland
Abstract :
We demonstrate that while significant efforts have been put on filtering the signal lines of low-temperature metallic nanoscale devices, the quality of radiation shielding has been overlooked. We describe a double-shielded sample stage that is shown to significantly improve the performance of single-electron devices. We also demonstrate a record-low density of quasi-particles in a superconductor.
Keywords :
electromagnetic shielding; interference suppression; nanoelectronics; quasiparticles; single electron devices; superconducting junction devices; low temperature metallic nanoscale device; quasiparticle; radiation shielding; shielded sample stage; signal line filtering; single electron device; superconductor; Powders; Superconducting device noise; Superconducting filters; Thermal noise; Tunneling; Electromagnetic shielding; charge pumps; filtering; metrology; nanoscale devices; single electron devices;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6251124
