DocumentCode
2751925
Title
On the use of clustering and local singular spectrum analysis to remove ocular artifacts from electroencephalograms
Author
Teixeira, A.R. ; Tomé, A.M. ; Lang, E.W. ; Gruber, P. ; Da Silva, A. Martins
Author_Institution
DETUA/IEETA, Aveiro Univ., Portugal
Volume
4
fYear
2005
fDate
July 31 2005-Aug. 4 2005
Firstpage
2514
Abstract
We present a method based on singular spectrum analysis to remove ocular artifacts (EOG) from an electroencephalogram (EEC). After embedding the EEG signals in a feature space of time-delayed coordinates, feature vectors are clustered and the principal components (PCs) are computed locally within each cluster. Then we assume that the EOG artifact is associated with the PCs belonging to the largest eigenvalues. We incorporate a minimum description length (IMDL) criterion to estimate the number of eigenvectors needed to represent the EOG artifact faithfully. The EOG signal thus extracted is then subtracted from the original EEG signal to obtain the corrected EEG signal we are interested in.
Keywords
electroencephalography; medical signal processing; pattern clustering; principal component analysis; EEG signals; electroencephalograms; feature vectors; minimum description length criterion; singular spectrum analysis; time-delayed coordinates; Additive noise; Data mining; Electrodes; Electroencephalography; Electrooculography; Eyes; Independent component analysis; Personal communication networks; Principal component analysis; Time series analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2005. IJCNN '05. Proceedings. 2005 IEEE International Joint Conference on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-9048-2
Type
conf
DOI
10.1109/IJCNN.2005.1556298
Filename
1556298
Link To Document