Title :
Putting the squeeze on test sequences
Author :
Rudnick, Elizabeth M. ; Patel, Janak H.
Author_Institution :
Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
Abstract :
Dynamic test sequence compaction is an effective means of reducing test application time and often results in higher fault coverages and reduced test generation time as well. A new algorithm for dynamic test sequence compaction is presented that uses genetic techniques to evolve test sequences. Test sequences provided by a test generator and previously evolved sequences already included in the test set are used as seeds in the genetic population. Significant improvements in test set size, fault coverage, and test generation time have been obtained over previous approaches
Keywords :
automatic testing; fault location; genetic algorithms; logic testing; algorithm; dynamic test sequence compaction; fault coverage; genetic techniques; test application time; test generation time; test sequences; test set size; Circuit faults; Circuit simulation; Circuit testing; Compaction; Electrical fault detection; Fault detection; Genetics; Heuristic algorithms; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639685
