Title :
Analysis of transient grounding resistance under pulsed discharging current
Author :
He Hongbing ; Zhou Bihua ; Yu Tongbing ; Chen Jiaqing ; Yang Chunshan ; Ren Hemin
Author_Institution :
EMP Lab., Nanjing Eng. Inst., China
Abstract :
This paper presents numerical analysis of the transient grounding resistance of the grounding conductor under pulsed discharging current using the FDTD method; and analyses the influence of its size, buried depth and the ground conductivity. In the end, methods for reducing transient grounding resistance and discharging faster are discussed.
Keywords :
discharges (electric); earthing; electrical conductivity; finite difference time-domain analysis; transient analysis; FDTD method; buried depth; ground conductivity; grounding conductor size; numerical analysis; pulsed discharging current; transient grounding resistance; Conductors; Electromagnetic transients; Finite difference methods; Frequency; Grounding; Interference; Time domain analysis; Transient analysis; Voltage; Wire;
Conference_Titel :
Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Asia-Pacific Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
7-5635-0802-3
DOI :
10.1109/CEEM.2003.238411
