DocumentCode
2751970
Title
Analysis of transient grounding resistance under pulsed discharging current
Author
He Hongbing ; Zhou Bihua ; Yu Tongbing ; Chen Jiaqing ; Yang Chunshan ; Ren Hemin
Author_Institution
EMP Lab., Nanjing Eng. Inst., China
fYear
2003
fDate
4-7 Nov. 2003
Firstpage
554
Lastpage
557
Abstract
This paper presents numerical analysis of the transient grounding resistance of the grounding conductor under pulsed discharging current using the FDTD method; and analyses the influence of its size, buried depth and the ground conductivity. In the end, methods for reducing transient grounding resistance and discharging faster are discussed.
Keywords
discharges (electric); earthing; electrical conductivity; finite difference time-domain analysis; transient analysis; FDTD method; buried depth; ground conductivity; grounding conductor size; numerical analysis; pulsed discharging current; transient grounding resistance; Conductors; Electromagnetic transients; Finite difference methods; Frequency; Grounding; Interference; Time domain analysis; Transient analysis; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Electromagnetics, 2003. CEEM 2003. Proceedings. Asia-Pacific Conference on
Conference_Location
Hangzhou, China
Print_ISBN
7-5635-0802-3
Type
conf
DOI
10.1109/CEEM.2003.238411
Filename
1282392
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