DocumentCode :
2752010
Title :
High heat flux cooling for silicon-on-silicon packaging
Author :
Jaeger, Richard C. ; Ellis, Charles D. ; Goodling, John S. ; Williamson, N. Vincent ; Baginski, Michael E. ; O´Barr, R.M.
Author_Institution :
Alabama Microelectron. Sci. & Technol. Center, Auburn Univ., AL, USA
fYear :
1989
fDate :
7-9 Feb. 1989
Firstpage :
104
Lastpage :
111
Abstract :
The authors report the first data on cooling of silicon substrates using pool boiling of Freon-12 and compare the results to liquid-jet impingement cooling of the same substrates. Heater fluxes of 2000 W/cm/sup 2/ at a maximum temperature rise of 50 K have been achieved using 16 jets impinging at 1 m/s. Pool boiling experiments have reached heater fluxes of 100 W/cm/sup 2/ with a 50 K temperature rise. Results from two-dimensional numerical simulation of the test section are in excellent agreement with the pool boiling data. These results indicate that both modes of cooling should be useful in cooling advanced packages. The authors demonstrate the use of monolithic integrated circuit fabrication techniques in the development of test sections for heat transfer measurements. A double-sided integrated circuit process has been used to fabricate a novel isothermal test section for direct measurement of heat transfer coefficients.<>
Keywords :
cooling; digital simulation; elemental semiconductors; heat sinks; integrated circuit technology; monolithic integrated circuits; packaging; silicon; thermal variables measurement; 50 K; Freon-12; Si-Si; double-sided integrated circuit; heat transfer coefficients; heat transfer measurements; high heat flux cooling; isothermal test; liquid-jet impingement cooling; monolithic integrated circuit fabrication; pool boiling; two-dimensional numerical simulation; Circuit testing; Cooling; Heat transfer; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit testing; Monolithic integrated circuits; Numerical simulation; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal and Temperature Measurement Symposium, 1989. SEMI-THERM V., Fifth Annual IEEE
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/STHERM.1989.76074
Filename :
76074
Link To Document :
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