Title :
Mixed-signal SoC testing: is mixed-signal design-for-test on its way?
Author :
Wey, Chin-Long ; Osseiran, Adam ; Huertas, Jose Luis
Author_Institution :
Michigan State University
Keywords :
Analog-digital conversion; Built-in self-test; Circuit testing; Design for testability; Embedded software; Europe; Microprocessors; Scheduling; Software standards; System-on-a-chip;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893595
