DocumentCode
2752011
Title
Mixed-signal SoC testing: is mixed-signal design-for-test on its way?
Author
Wey, Chin-Long ; Osseiran, Adam ; Huertas, Jose Luis
Author_Institution
Michigan State University
fYear
2000
fDate
2000
Firstpage
15
Lastpage
15
Keywords
Analog-digital conversion; Built-in self-test; Circuit testing; Design for testability; Embedded software; Europe; Microprocessors; Scheduling; Software standards; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
ISSN
1081-7735
Print_ISBN
0-7695-0887-1
Type
conf
DOI
10.1109/ATS.2000.893595
Filename
893595
Link To Document