Title :
A built-in self-test and self-diagnosis scheme for embedded SRAM
Author :
Wang, Chih-Wea ; Wu, Chi-Feng ; Li, Jin-Fu ; Wu, Cheng-Wen ; Teng, Tony ; Chiu, Kevin ; Lin, Hsiao-Ping
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Embedded memory test and diagnosis is becoming an important issue in system-on-chip (SOC) development. Direct access of the memory cores from the limited number of I/O pins is usually not feasible. Built-in self-diagnosis (BISD), which include built-in self-test (BIST), is rapidly becoming the most acceptable solution. We propose a BISD design and a fault diagnosis system for embedded SRAM. It supports manufacturing test as well as diagnosis for design verification and yield improvement. The proposed BISD circuit is on-line programmable for its March test algorithms. Test chips have been designed and implemented. Our experimental results show that the BISD hardware overhead is about 2.4% for a typical 128 Kb SRAM and only 0.65% for a 2 Mb SRAM
Keywords :
SRAM chips; built-in self test; fault diagnosis; built-in self-test; embedded SRAM; fault diagnosis; memory test; self-diagnosis scheme; system-on-chip; Bandwidth; Built-in self-test; Circuit faults; Fault diagnosis; Hardware; Logic testing; Pins; Random access memory; System testing; System-on-a-chip;
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
Print_ISBN :
0-7695-0887-1
DOI :
10.1109/ATS.2000.893601
