Title :
Laser beam profiling by waveguide technique
Author :
Shulga, A.V. ; Khomchenko, A.V. ; Sotsky, A.B.
Author_Institution :
Belarusian-Russian Univ., Mogilev, Belarus
fDate :
July 28 2010-Aug. 1 2010
Abstract :
The resonant prism-coupling technique for measuring of light beam intensity distribution is presented. This approach is based on recording of the angular dependence of intensity of the reflected laser beam in the case of excitation of guided mode in testing thin-film structure. Analysis of the spatial intensity spectrum is considered.
Keywords :
intensity measurement; laser modes; light reflection; measurement by laser beam; optical films; optical prisms; optical testing; optical variables measurement; optical waveguides; reflectometry; guided mode; laser beam profiling; light beam intensity distribution; light reflection; resonant prism-coupling technique; spatial intensity spectrum; thin-film structure testing; waveguide technique; Couplers; Laser beams; Laser excitation; Measurement by laser beam; Optical films; Optical waveguides; Waveguide lasers; Fourier spectrum; light beam profiling; prism coupler; waveguide;
Conference_Titel :
Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5511-9
DOI :
10.1109/RCSLPLT.2010.5615326
